SOLUTIONS
> Side Channel Analysis
Ready-to-use side channel tools to assess cryptography algorithms.
> Laser & EM Fault Injection
Make sure your chip withstands different techniques of physical fault injections.
> Firmware Security Analysis
Qualify embedded code binaries without physical devices and benches.
> Security Failure Analysis
Photoemission analysis to explore internal information in a chip.
> Vulnerability Research
Dynamic analyses at a system level for investigating potential vulnerabilities.
TECHNOLOGIES
> Data Science Platform
esDynamic is a complete data focused platform to leverage the know-how of your team for complex analyses.
> esFirmware Engine
Assess the security of the firmware of IoT devices against logical and physical attacks.
> REVEN Engine
Record and replay vulnerability researches within reverse engineering processes and tools.
PROFESSIONAL SERVICES
> Cybersecurity Training
Grow your expertise with training modules driven by a coach.
EXPERTISE
> Mobile App Security
Know the threats and risks of your Mobile App.
> DevSecOps
Integrate the security protections verification in your CI/CD pipeline.
SOLUTIONS
> Automated Mobile App Security Testing
esChecker SaaS: automating the security testing of your mobile app binary.
> Mobile App Penetration Testing
Testing the resiliency of your Mobile App, SDK or RASP tool.
> Backend Penetration Testing
Testing the resiliency of your Web App, API or Backend Systems.
PROFESSIONAL SERVICES
> Coaching for Mobile App Developers
Providing insights into the mobile app threats and how attackers work by a learning-by-doing approach.
OUR COMPANY
> Events
CARREERS
> Meet our experts
> Open positions
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Photoemission analysis
What is required to make photoemission analysis?
Photoemission analysis is a complex technique requiring high quality of back-side imaging in the infrared wavelength. The image quality can only be achieved by combining a well-chosen camera with an optimized optical system.
Besides the experimental setup, solid know-how in photoemission analysis is needed. Many techniques must be mastered, such as testing procedures, camera tuning, image processing, relevant information extraction, etc.
Photoemission bench
ALPhANOV and eShard developed a ready-to-use photoemission solution for chip security analysis. ALPhANOV optical solution integrates:
- An optical system optimized to back-side imaging
- An infrared camera chosen for low-noise and high-quality imaging
- A photon detector system to perform analyses in space and time
It can be mounted like a stand alone system or like an extension of an existing bench, such as an LMS station.
Software solution for photoemission analysis
A comprehensive expertise module has been developed to run photoemission analysis of the esDynamic data sciences platform.
It includes:
- All software to drive each individual equipment of the photoemission bench via APIs and widgets
- Integrated photoemission techniques to automate scanning, image building and analysis
- A set of know-how notebooks to quickly get up to speed in photoemission security analysis
The photoemission analysis module is regularly updated in line with eShard R&D developments.
Our specialized lab
Our lab hosts a state-of-the-art solution to implement photoemission analysis: the photoemission bench is provided by ALPhANOV, as part of our close partnership in their secure premises, and the software platform is from eShard.
Our expert team can run photoemission analysis on devices provided by our customers based on their requirements. This can be to better understand the photoemission technique or to figure out what type of information can leak from a device with a photoemission analysis technique.
Recent projects performed in our lab
- Photoemission analysis on a multi-core high speed (1+ GHz) ARMv8 SoC (System on Chip)
Our clients
"Purchase and installation went really great. Support responds very fast and is helpful in all questions. Offers also remote sessions for troubleshooting and for practice. Before the purchase we were offered a 30 day trial version (free of charge)."
